Login / Signup

Voltage acceleration of time dependent breakdown of ultra-thin NO and NON dielectrics.

Peter Hofmann
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • power system
  • high speed
  • power supply
  • high voltage
  • power losses
  • transmission line
  • travel time
  • low voltage
  • database
  • information retrieval
  • data sets
  • metal oxide