Model-Based Test Case Generation for Smart Cards.
Jan PhilippsAlexander PretschnerOscar SlotoschErnst AiglstorferStefan KriebelKai SchollPublished in: Electron. Notes Theor. Comput. Sci. (2003)
Keyphrases
- high level
- smart card
- test case generation
- test cases
- software testing
- object oriented systems
- java card
- test data generation
- digital signature
- secret key
- information security
- test suite
- security analysis
- java programs
- power analysis
- object oriented
- security mechanisms
- authentication protocol
- differential power analysis
- remote user authentication scheme
- static analysis
- software systems
- software development
- data sets
- intrusion detection
- data model
- case study