Manufacturing Yield Improvement by Clustering.
M. A. KarimSaman K. HalgamugeA. J. R. SmithArthur L. HsuPublished in: ICONIP (3) (2006)
Keyphrases
- clustering algorithm
- clustering method
- k means
- self organizing maps
- data clustering
- significant improvement
- unsupervised learning
- graph theoretic
- production planning
- manufacturing systems
- decision trees
- hierarchical clustering
- distance metric
- manufacturing processes
- quality control
- cluster analysis
- neural network
- feature selection