A novel built-in self-repair approach to VLSI memory yield enhancement.

Pinaki Mazumder Jih-Shyr Yih

Published in: ITC (1990)

Keyphrases

signal processing
memory space
image enhancement
memory footprint
image processing
vlsi circuits
vlsi design
memory requirements
computing power
random access
edge detection
limited memory
computational complexity
data streams
damage assessment
memory capacity
neural network