Spiral scanning of atomic force microscope for faster imaging.

M. S. Rana Hemanshu Roy Pota Ian R. Petersen Habibullah

Published in: CDC (2013)

Keyphrases

image processing
imaging systems
scan data
single shot
image analysis
high resolution
medical imaging
visual inspection
acquired images
imaging devices
light field
atomic force microscopy
imaging technology
memory efficient
data sets
super resolution
digital images
image segmentation
computer vision
neural network