Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology.
Anna BrookEdison CristofaniMathias BecquaertBen LauwensJoachim JonuscheitMarijke VandewalPublished in: J. Electronic Imaging (2013)
Keyphrases
- compressive sensing
- defect detection
- image processing
- three dimensional
- signal processing
- d objects
- image recovery
- feature extraction
- random projections
- semi supervised
- depth map
- sparse representation
- high resolution
- computer vision
- image representation
- multiscale
- dimension reduction
- machine vision
- image data
- pattern recognition
- image sequences
- compressive sampling
- image restoration
- structured sparsity
- distributed source coding