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2-level LFSR scheme with asynchronous test pattern transfer for low cost and high efficiency build-in-self-test.
Seung-Moon Yoo
Seong-Ook Jung
Sung-Mo Kang
Published in:
ACM Great Lakes Symposium on VLSI (2001)
Keyphrases
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high efficiency
low cost
data sets
high accuracy
statistical significance
database
genetic algorithm
case study
motion estimation
test cases
pattern matching
low power