Test set generation almost for free using a run-time FPGA reconfiguration technique.

Alexandra Kourfali Dirk Stroobandt

Published in: LATS (2015)

Keyphrases

test set
error rate
training set
training data
test data
evaluation methodology
low cost
high speed
real time
hardware implementation
class distribution
data sets
field programmable gate array
computer vision
active learning
training and test data