Login / Signup
Combining Functional and Structural Approaches for Switched-Current Circuit Testing.
Michel Renovell
Florence Azaïs
J.-C. Bodin
Yves Bertrand
Published in:
J. Electron. Test. (2000)
Keyphrases
</>
high speed
strengths and weaknesses
databases
training set
alternative approaches
promising directions
data sets
neural network
machine learning
information retrieval
decision trees
evolutionary algorithm
electronic circuits