Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding.
Haiying YuanJiaping MeiHongying SongKun GuoPublished in: J. Electron. Test. (2014)
Keyphrases
- test data
- run length coding
- image compression
- huffman coding
- data compression
- compression ratio
- test cases
- entropy coding
- compression scheme
- test set
- training data
- compression algorithm
- training set
- arithmetic coding
- lossless compression
- low bit rate
- training samples
- data mining
- data sets
- wavelet transform
- high quality
- supervised learning
- data structure
- reconstructed image
- compressed images
- image processing