Sampling pattern design algorithm for atomic force microscopy images.
Yufan LuoSean B. AnderssonPublished in: ICIP (2017)
Keyphrases
- segmentation algorithm
- image processing algorithms
- dynamic programming
- learning algorithm
- synthetic and real images
- image set
- test images
- detection algorithm
- gaussian noise
- similarity measure
- computational complexity
- segmentation method
- image processing
- matching algorithm
- expectation maximization
- input image
- image data
- three dimensional
- image classification
- optimal solution
- sampling theorem
- preprocessing stage
- multiscale
- region of interest
- monte carlo
- k means
- object recognition
- image matching
- recognition algorithm
- objective function
- image analysis
- perspective images
- imaging process
- thresholding algorithm
- image database