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RFID Test Platform: Nonlinear Characterization.
Gianfranco Andia Vera
Yvan Duroc
Smail Tedjini
Published in:
IEEE Trans. Instrum. Meas. (2014)
Keyphrases
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real time
test data
database
neural network
data collection
lightweight
rfid tags
image processing
test cases
mobile applications
rfid technology