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Automatic testing and evaluation of digital integrated circuits: J T Healy, Reston (1981) 236 pp £14.25.

Joe Gallacher
Published in: Microprocess. Microsystems (1981)
Keyphrases
  • integrated circuit
  • fully automatic
  • automatic evaluation
  • data sets
  • electron beam
  • video sequences
  • data driven
  • evaluation metrics
  • metal oxide semiconductor