Bayesian Regression for Artifact correction in Electroencephalography.
Karl-Heinz FiebigVinay JayaramThomas HesseAlexander BlankJan PetersMoritz Grosse-WentrupPublished in: GBCIC (2017)
Keyphrases
- sparse bayesian learning
- gaussian processes
- relevance vector machine
- regression model
- dirichlet process mixture
- data driven
- partial least squares
- linear regression
- error correction
- polynomial regression
- regression problems
- model selection
- maximum likelihood
- bayesian decision
- bayesian learning
- gaussian process regression
- regression analysis
- model averaging
- error detection
- neural network
- locally weighted
- nonlinear regression
- regression algorithm
- simple linear
- posterior probability
- gaussian process
- posterior distribution
- bayesian inference