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Reliability of high voltage/high power L/S-band Hbt technology.

Benoit LambertG. JonssonJ. BatailleC. OllivierP. MezengeH. DerewonkoH. ThomasD. FloriotHervé BlanckC. Moreau
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • high voltage
  • high power
  • low power
  • high density
  • cost effective
  • normal operation
  • operating conditions
  • power supply
  • partial discharge
  • real time
  • neural network