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12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition.

Yoshiaki DeguchiToshiki NakamuraAtsuro KobayashiKen Takeuchi
Published in: CICC (2017)
Keyphrases
  • image recognition
  • image processing
  • high quality
  • pattern recognition
  • video coding
  • data acquisition
  • data quality