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12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition.
Yoshiaki Deguchi
Toshiki Nakamura
Atsuro Kobayashi
Ken Takeuchi
Published in:
CICC (2017)
Keyphrases
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image recognition
image processing
high quality
pattern recognition
video coding
data acquisition
data quality