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Thermal modeling of single event burnout failure in semiconductor power devices.

D. Greg WalkerT. S. FisherJ. LiuRonald D. Schrimpf
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • power consumption
  • infrared
  • search engine
  • bayesian networks
  • mobile devices
  • spatio temporal
  • event detection
  • embedded systems
  • modeling language
  • modeling method
  • event driven
  • embedded devices
  • thermal images