Image Enhancement and Features Extraction of Electron Microscopic Images Using Sigmoid Function and 2D-DCT.
Vivek AryaHemant ChoubeySandeep SharmaTe-Yu ChenCheng-Chi LeePublished in: IEEE Access (2022)
Keyphrases
- image enhancement
- features extraction
- microscopic images
- sigmoid function
- imprecise data
- fingerprint images
- image processing
- microscopy images
- feature extraction
- electron microscopy
- image analysis
- automatic classification
- microscope images
- neural network
- wavelet transform
- edge detection
- character recognition
- multiscale
- extracted features
- image segmentation
- contrast enhancement
- x ray
- medical images
- machine learning