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Testing Methodology of Embedded DRAMs.

Hao-Yu YangChi-Min ChangMango Chia-Tso ChaoRei-Fu HuangShih-Chin Lin
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
  • databases
  • test cases
  • theoretical framework
  • information retrieval
  • three dimensional
  • model based testing
  • database
  • object oriented
  • software development life cycle