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A Genetic Algorithm-Based Heuristic Method for Test Set Generation in Reversible Circuits.
A. N. Nagamani
S. N. Anuktha
N. Nanditha
Vinod Kumar Agrawal
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)
Keyphrases
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test set
error rate
dynamic programming
test data
detection method
heuristic methods
optimal solution
training set
detection algorithm
learning algorithm
support vector
search algorithm
k means
feature set
simulated annealing