Login / Signup
VLSI Testing: A Decade of Experience.
Earl E. Swartzlander Jr.
John A. Eldon
De D. Hsu
Published in:
COMPCON (1985)
Keyphrases
</>
signal processing
high speed
test cases
learning curve
vlsi design
user experience
real time
learning environment
video sequences
pattern recognition
information technology
software testing
vlsi circuits