Low Cost MIMO Testing for RF Integrated Circuits.

Erkan Acar Sule Ozev

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2010)

Keyphrases

integrated circuit
low cost
electron beam
real time
low power
hardware and software
test cases
digital camera
printed circuit boards
metal oxide semiconductor
hardware description language
multiple input
highly efficient
embedded systems
data acquisition
software development
relevance feedback