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The dependence of polarimetric coherence on surface roughness for very rough surfaces.

Saurabh MalhotraDayalan KasilingamDale L. Schuler
Published in: IGARSS (2003)
Keyphrases
  • surface roughness
  • rough surfaces
  • specular reflection
  • manufacturing process
  • curved surfaces
  • viewpoint
  • subsurface scattering
  • image formation
  • process control
  • illumination direction