Circuit Reliability of $\text{MoS}_{2}$ Channel Based 2D Transistors.
Anand Kumar RaiHarsha B. VariarMayank ShrivastavaPublished in: IRPS (2023)
Keyphrases
- flip flops
- multiple input
- circuit design
- field effect transistors
- information retrieval
- cmos technology
- text retrieval
- power consumption
- real time
- multiple output
- high density
- communication channels
- text mining
- text information
- high speed
- database
- noisy channel
- metadata
- multiple access
- digital libraries
- reliability analysis
- text documents
- string matching
- key concepts
- multi channel
- free text
- low power
- steady state