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Reliability of Diode-Integrated SiC Power MOSFET(DioMOS).

Osamu KusumotoAtsushi OhokaNobuyuki HorikawaKohtaro TanakaMasahiko NiwayamaMasao UchidaYoshihiko KanzawaKazuyuki SawadaTetsuzo Ueda
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • computer simulation
  • data sets
  • power consumption
  • artificial intelligence
  • multiscale
  • highly reliable
  • reliability analysis
  • machine learning
  • similarity measure
  • power grid