Formalized Three-Layer System-Level Reuse Model and Methodology for Embedded Data-Dominated Applications.
Frederik VermeulenFrancky CatthoorHugo De ManDiederik VerkestPublished in: DATE (2000)
Keyphrases
- data sets
- experimental data
- probabilistic model
- test data
- training data
- data structure
- prior knowledge
- input data
- database
- raw data
- predictive model
- data collection
- conceptual model
- probability distribution
- multi layer
- statistical methods
- original data
- simulation data
- measured data
- computational model
- high dimensional data
- image data
- databases
- high quality
- data points
- statistical model
- data processing
- data sources
- data quality
- high level
- computer systems
- theoretical framework
- maximum likelihood
- higher level
- knowledge discovery
- em algorithm
- prior information
- parameter estimation
- data mining
- statistical analysis