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Formalized Three-Layer System-Level Reuse Model and Methodology for Embedded Data-Dominated Applications.
Frederik Vermeulen
Francky Catthoor
Hugo De Man
Diederik Verkest
Published in:
DATE (2000)
Keyphrases
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data sets
experimental data
probabilistic model
test data
training data
data structure
prior knowledge
input data
database
raw data
predictive model
data collection
conceptual model
probability distribution
multi layer
statistical methods
original data
simulation data
measured data
computational model
high dimensional data
image data
databases
high quality
data points
statistical model
data processing
data sources
data quality
high level
computer systems
theoretical framework
maximum likelihood
higher level
knowledge discovery
em algorithm
prior information
parameter estimation
data mining
statistical analysis