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Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration.
Hiroaki Konoura
Yukio Mitsuyama
Masanori Hashimoto
Takao Onoye
Published in:
ISQED (2010)
Keyphrases
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comparative study
high speed
power dissipation
circuit design
probability distribution
power consumption
higher level
accurate estimation
database
learning algorithm
low cost
posterior probability
levels of abstraction
estimation accuracy