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A shared built-in self-repair analysis for multiple embedded memories.
Jun Ohtani
Tukasa Ooishi
Tomoya Kawagoe
Mitsutaka Niiro
Masanao Maruta
Hideto Hidaka
Published in:
CICC (2001)
Keyphrases
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artificial intelligence
data analysis
statistical analysis
real world
data mining
similarity measure
data structure
wireless sensor networks