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A shared built-in self-repair analysis for multiple embedded memories.

Jun OhtaniTukasa OoishiTomoya KawagoeMitsutaka NiiroMasanao MarutaHideto Hidaka
Published in: CICC (2001)
Keyphrases
  • artificial intelligence
  • data analysis
  • statistical analysis
  • real world
  • data mining
  • similarity measure
  • data structure
  • wireless sensor networks