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Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash Memories to Suppress Both Lateral Charge Migration and Vertical Charge De-trap and Increase Data-retention Time by 2.7x.

Shun SuzukiYoshiaki DeguchiToshiki NakamuraKen Takeuchi
Published in: ESSDERC (2018)
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