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films observed with conductive atomic force microscope.

Marc PortiX. BlascoMontserrat NafríaXavier AymerichAlexander OlbrichBernd Ebersberger
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • case study
  • data sets
  • machine learning
  • artificial intelligence
  • image processing
  • probabilistic model