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Optical lithography: Introduction.

George L.-T. ChiuJane M. Shaw
Published in: IBM J. Res. Dev. (1997)
Keyphrases
  • electron beam
  • x ray
  • infrared
  • design parameters
  • solid state
  • neural network
  • information retrieval
  • social networks
  • computer vision
  • image segmentation
  • image sequences
  • special case
  • long period
  • light scattering