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Thin-film Thickness Absolute Measurement by Differential Optic-fiber White Light Interferometry.
Xu Lu
Zhangjun Yu
Jun Yang
Yonggui Yuan
Hanyang Li
Libo Yuan
Published in:
I2MTC (2019)
Keyphrases
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white light interferometry
film thickness
thin film
refractive index
high density
fiber optic
electrical properties
diffusion tensor imaging
image processing
room temperature