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Thin-film Thickness Absolute Measurement by Differential Optic-fiber White Light Interferometry.

Xu LuZhangjun YuJun YangYonggui YuanHanyang LiLibo Yuan
Published in: I2MTC (2019)
Keyphrases
  • white light interferometry
  • film thickness
  • thin film
  • refractive index
  • high density
  • fiber optic
  • electrical properties
  • diffusion tensor imaging
  • image processing
  • room temperature