Login / Signup

Iterative Parallel Test to Detect and Diagnose Multiple Defects for Digital Microfluidic Biochip.

Sourav GhoshDolan MaityArijit ChowdhurySurajit Kumar RoyChandan Giri
Published in: ATS (2019)
Keyphrases
  • parallel processing
  • digital libraries
  • fault diagnosis
  • data sets
  • real world
  • machine learning
  • learning algorithm
  • detection algorithm