Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements.
Fang LiuSule OzevMartin A. BrookePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
- high frequency
- analog circuits
- low frequency
- high resolution
- visual quality
- digital circuits
- wavelet transform
- fault diagnosis
- subband
- transfer function
- high frequency components
- low pass
- wavelet coefficients
- discrete wavelet transform
- frequency band
- wavelet domain
- high frequencies
- multiresolution
- dct coefficients
- dynamic systems
- data fusion
- low bit rate coding