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Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators.

Haldun KüflüogluCathy ChancellorMin ChenClaude CirbaVijay Reddy
Published in: ACM J. Emerg. Technol. Comput. Syst. (2014)
Keyphrases
  • positive and negative
  • database
  • machine learning
  • information retrieval
  • case study
  • high speed
  • modeling language
  • room temperature
  • transient response