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ESD reliability building in 0.25 μm 60-V p-channel LDMOS DUTs with different embedded SCRs.

Shen-Li ChenYu-Ting HuangShawn ChangShun-Bao Chang
Published in: ICCE-TW (2015)
Keyphrases
  • embedded systems
  • real world
  • data mining
  • artificial intelligence
  • hidden markov models
  • wireless sensor networks
  • end to end
  • multi channel
  • highly reliable
  • reliability analysis
  • control software
  • noisy channel