Login / Signup

Confirmation of the Instrumental Difference for Each Ion-Sensitive Field-Effect Transistors to Evaluate Mental Workload.

Kenichi KitamuraKoji MuraiShin-Ichi Wakida
Published in: SMC (2020)
Keyphrases
  • schottky barrier
  • field effect transistors
  • response time
  • semiconductor devices
  • mathematical analysis
  • high density
  • data sets
  • knowledge base
  • video sequences
  • search algorithm
  • mental states