Improving quality: Yield versus test coverage.
Steven D. MillmanPublished in: J. Electron. Test. (1994)
Keyphrases
- code coverage
- test suite
- high quality
- test cases
- software testing
- information retrieval
- statistical significance
- expert systems
- quality assessment
- evolutionary algorithm
- software quality
- higher quality
- software systems
- object oriented
- database
- artificial neural networks
- multiscale
- training data
- artificial intelligence
- neural network
- real time