Fine-Grain Redundant Logic Using Defect-Prediction Flip-Flops.
Toru NakuraKoichi NoseMasayuki MizunoPublished in: ISSCC (2007)
Keyphrases
- fine grain
- flip flops
- defect prediction
- coarse grain
- multiple input
- parallel computation
- software repositories
- power dissipation
- distributed memory
- master slave
- software projects
- nested transactions
- cmos technology
- general purpose
- data processing
- real time
- source code
- software engineering
- scheduling problem
- data model