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Pattern-driven parallel I/O tuning.

Babak BehzadSurendra Byna PrabhatMarc Snir
Published in: PDSW@SC (2015)
Keyphrases
  • pattern matching
  • data driven
  • data sets
  • pattern detection
  • real time
  • databases
  • computer vision
  • database systems
  • pattern discovery
  • parameter tuning
  • fine tuning
  • physical design