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DeSyRe: On-demand system reliability.

Ioannis SourdisChristos StrydisAntonino ArmatoChristos-Savvas BouganisBabak FalsafiGeorgi Nedeltchev GaydadjievSebastián IsazaAlirad MalekR. MarianiDionisios N. PnevmatikatosDhiraj K. PradhanGerard K. RauwerdaRobert M. SeepersRishad A. ShafikKim SunesenDimitris TheodoropoulosStavros TzilisMichalis Vavouras
Published in: Microprocess. Microsystems (2013)
Keyphrases
  • pattern recognition
  • database
  • highly reliable
  • cloud computing
  • reliability assessment
  • real time
  • metadata
  • three dimensional
  • probabilistic model