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On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs.

Leonidas KatselasAlkis A. HatzopoulosHailong JiaoChristos PapameletisErik Jan Marinissen
Published in: ITC (2018)
Keyphrases
  • real time
  • circuit design
  • data mining
  • evolutionary algorithm
  • high speed
  • statistically significant