An improved model-based method to test circuit faults.
Xiaochun ChengDantong OuyangYunfei JiangChengqi ZhangPublished in: Theor. Comput. Sci. (2005)
Keyphrases
- synthetic data
- cost function
- high accuracy
- fully automatic
- high precision
- test data
- data sets
- support vector machine
- dynamic programming
- pairwise
- objective function
- similarity measure
- artificial neural networks
- theoretical analysis
- knowledge base
- clustering algorithm
- segmentation method
- detection method
- optimization algorithm
- feature set
- high speed
- preprocessing
- computationally efficient
- mutual information
- support vector machine svm
- clustering method
- multiscale
- classification accuracy
- fault diagnosis
- experimental evaluation
- neural network