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3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition.
Yoshiaki Deguchi
Toshiki Nakamura
Atsuna Hayakawa
Ken Takeuchi
Published in:
IEEE J. Solid State Circuits (2019)
Keyphrases
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image recognition
error tolerant
solid state
graph matching
pattern recognition
image classification
flash memory
face recognition
image processing
random access
association patterns
search algorithm
image analysis
multi dimensional