A Pattern Recognition Method for Scene Sketch Images Using Deep Learning and Its Evaluation.
Kengo OshimaNoboru TakagiKei SawaiHiroyuki MasutaTatsuo MotoyoshiPublished in: SCIS/ISIS (2020)
Keyphrases
- pattern recognition
- deep learning
- segmentation method
- test images
- three dimensional
- target object
- multiple objects
- multiple images
- image regions
- similarity measure
- region of interest
- machine learning
- segmentation algorithm
- image classification
- input image
- video sequences
- single image
- unsupervised learning
- image features
- k means
- image retrieval
- object recognition
- image processing