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A Robust Automated Scan Pattern Mismatch Debugger.
Kun-Han Tsai
Ruifeng Guo
Wu-Tung Cheng
Published in:
ATS (2008)
Keyphrases
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pattern matching
image noise
databases
data driven
parameter tuning
semi automated
real time
learning algorithm
three dimensional
partial occlusion
pattern discovery
fully automated
parallel computing