Login / Signup

Reliability issues for flip-chip packages.

Paul S. HoGuotao WangMin DingJie-Hua ZhaoXiang Dai
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • key issues
  • low cost
  • high speed
  • search engine
  • physical design
  • vlsi design
  • database
  • databases
  • real world
  • information systems
  • reliability analysis
  • programmable logic