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Wireless wafer-level testing of integrated circuits via capacitively-coupled channels.

Dae Young LeeDavid D. WentzloffJohn P. Hayes
Published in: DDECS (2011)
Keyphrases
  • integrated circuit
  • wireless networks
  • test cases
  • cellular networks
  • image processing
  • higher level
  • context aware
  • multi channel
  • levels of abstraction
  • communication channels
  • printed circuit boards
  • electron beam