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Reliability prediction of semiconductor devices using modified physics of failure approach.
Adithya Thaduri
Ajit Kumar Verma
V. Gopika
Rajesh Gopinath
Uday Kumar
Published in:
Int. J. Syst. Assur. Eng. Manag. (2013)
Keyphrases
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semiconductor devices
failure prediction
failure rate
prediction accuracy
highly reliable
prediction model
prediction algorithm
computer science
electron beam
artificial intelligence
fuzzy logic
prediction error
low cost
root cause