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An 8T-SRAM for Variability Tolerance and Low-Voltage Operation in High-Performance Caches.

Leland ChangRobert K. MontoyeYutaka NakamuraKevin BatsonRichard J. EickemeyerRobert H. DennardWilfried HaenschDamir Jamsek
Published in: IEEE J. Solid State Circuits (2008)
Keyphrases
  • low voltage
  • random access memory
  • embedded dram
  • design considerations
  • leakage current
  • power line
  • cmos technology
  • power management
  • image processing
  • learning environment
  • video data
  • power consumption